Caption In situ XPS spectra of Ti 2p (a) and O 1s (b) in TiO2 in the dark and under illumination; (c) TOF-SIMS spectra of D depth profile of TiO2 in the dark and under illumination, in the mixture ...
The spectrometer offers better sensitivity than quad-SIM with full reference-quality spectra (m/z 1–1500 amu). It is supplied with the TOF-DS software, including on-the-fly deconvolution and dynamic ...
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